Integrated Device Design
"Integrated devices, which include VLSI (Very Large Scale Integration) as a representative, while achieving higher performances and large-scale integration due to miniaturization, also face serious design issues, such as the difficulty to correctly design large-scale circuits, statistical variations of device properties and reliability degradation of nano-scale devices. We are working on post-silicon design validation for large-scale complex silicon chips, and design for manufacturability and reliability to develop a device that can achieve required performances even with manufacturing and environmental fluctuation and device reliability degradation.
We are also working to develop new applications by exploring the possibilities of minimal volume computing utilizing VLSI."
- 2001 Ph.D. (Infomatics), Kyoto University
- 2001 Research Associate, Graduate School of Infomatics, Kyoto University
- 2004 Associate Professor, Graduate School of Information Science and Technology, Osaka University
- 2016 Professor, Graduate School of Information Science and Technology, Osaka University
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