VLSI Diagnosis Technique Development
Electronic equipment and machinery need diagnosis in the same way people need diagnosis in order to maintain their health. In the same way with human diagnosis, diagnosis of complex equipment is very difficult and faces many challenges. We have been conducting research on diagnostic technology for complex equipment, especially for VLSI (very large-scale integrated circuits). VLSI is indispensable to electronic devices such as personal computers and smartphones. A VLSI chip of 1 square-centimeter has on it billions of electronic components. Their diagnosis can be difficult, as each individual electronic component is of nanometer size and large numbers of components work together in complex structures. We are committed to the research and development of VLSI diagnosis techniques, by using state-of-the-art equipment laser terahertz emission microscopes (LTEM) and with the help of advanced information processing technologies such as image processing.
- 1994 Master (Engineering), Osaka University
- 1994 Assistant Professor, Faculty of Engineering, Osaka University
- 1997 Ph.D. (Engineering), Osaka University
- 1998 Assistant Professor, Graduate School of Engineering, Osaka University
- 2002 Assistant Professor, Graduate School of Information Science and Technology, Osaka University
- 2007 Associate Professor, Graduate School of Information Science and Technology, Osaka University
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